There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
SnTe
Name:
tin(II) telluride
CAS Registry No:
12040027
Class:
chalcogenide, IV-VI semiconductor, telluride

Citation:
Author Name(s):
Shalvoy R.B., Fisher G.B., Stiles P.J.
Journal:
Phys. Rev. B 15, 1680
DOI:
Pub Year:
1977

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d5/2
Binding Energy (eV)
24.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au, Na1s-2p=1041.1
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙