NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[ReCl(N₂)((C₆H₅)₂PCH₃)₄]

Name:

chloro(dinitrogen)tetrakis(methyldiphenylphosphine)rhenium

CAS Registry No:

25263927

Class:

chloride, nitrogen ligand, organometallic, phenyl benzene, phosphorous

Citation:

Author Name(s):

Nefedov V.I.

Journal:

Koord. Khim. 4, 1285

Pub Year:

1978

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

40.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):