NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

H₂CH₂CH(NH₂)C(O)OH

L-cysteine

52-90-4

amine, amino acid/its derivatives, carboxylic acid, nitrogen, organic acid, oxygen, sulfur

Citation:

Author Name(s):

Yu X.-R., Liu F., Wang Z.-Y., Chen Y.

Journal:

J. Electron Spectrosc. Relat. Phenom. 50, 159

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Data Type:

Auger Parameter

Line Designation:

AP-2p_3/2, KL₂₃L₂₃(¹D)

Auger Parameter (eV)

2277.65

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5=368.2

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):