NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

SiO₂,quartz

Name:

silicon(IV) dioxide (Quartz)

CAS Registry No:

60676-86-0

Class:

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:

Author Name(s):

Wagner C.D., Passoja D.E., Hillery H.F., Kinisky T.G., Six H.A., Jansen W.T., Taylor J.A.

Journal:

J. Vac. Sci. Technol. 21, 933

DOI:

Pub Year:

1982

book All Records in this Publication

Data Processing:

Auger-Electron Line

KL₂₃L₂₃(¹D)

1608.50

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 83.8,932.4. C1s = 284.6

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):