NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 11

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Si₃N₄

KL₂₃L₂₃(¹D)

1611.70

SiO₂,quartz

KL₂₃L₂₃(¹D)

1608.40

KL₂₃L₂₃(¹D)

1616.60

Si₃N₄

AP-2p_3/2, KL₂₃L₂₃(¹D)

1714.10

SiO₂,quartz

AP-2p_3/2, KL₂₃L₂₃(¹D)

1711.70

AP-2p_3/2, KL₂₃L₂₃(¹D)

1716.10

Si₃N₄

2p_3/2

102.40

SiO₂,quartz

2p_3/2

103.30

2p_3/2

99.50

Si₃N₄

398.50

SiO₂/(Si⁺Si₃N₄)

533.40

Data Processing:

Auger-Electron Line

KL₂₃L₂₃(¹D)

1608.40

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu

Charge Reference:

Int. O1s=532.5

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):