There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
copper
element

Citation:
Powell C.J., Erickson N.E., Jach T.
J. Vac. Sci. Technol. 20, 625
Pub Year:
1981

Data Processing:
Auger-Electron Line
L3M45M45(1G)

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
DVM e-beam,NiFL,MgK
Charge Reference:
Conductor
Energy Scale Evaluation:
Calibration study
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙