NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

GeSe

Name:

germanium(II) selenide

CAS Registry No:

12065100

Class:

chalcogenide, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Shalvoy R.B., Fisher G.B., Stiles P.J.

Journal:

Phys. Rev. B 15, 1680

DOI:

Pub Year:

1977

book All Records in this Publication

Data Processing:

Auger-Electron Line

L₃M₄₅M₄₅(¹G)

1143.80

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au, Na1s-2p=1041.1

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):