NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ZnO/Si

ZnO/Si

zinc(II) oxide on silicon

CAS Registry No:

1314132

Class:

oxide

Citation:

Author Name(s):

Raven M.S.

Journal:

Surf. Interface Anal. 1, 20

DOI:

Pub Year:

1979

book All Records in this Publication

Data Processing:

Auger-Electron Line

L₃M₄₅M₄₅(¹G)

988.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):