There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Zn
Formula:
ZnSe
Name:
zinc selenide
CAS Registry No:
1315-09-9
Class:
chalcogenide, II-VI semiconductor, selenide

Citation:
Author Name(s):
Langer D.W., Vesely C.J.
Journal:
Phys. Rev. B 2, 4885
DOI:
Pub Year:
1970

Data Processing:
Data Type:
Separation from the Strongest Auger Line
Line Designation:
SA-L2M23M45(1F)
Separation Energy (eV)
-53.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙