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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cu
Formula:
Cu
Name:
copper
CAS Registry No:
7440-50-8
Class:
element

Citation:
Author Name(s):
Kim K.S., Gaarenstroom S.W., Winograd N.
Journal:
Chem. Phys. Lett. 41, 503
DOI:
Pub Year:
1976

Data Processing:
Data Type:
Separation from the Strongest Auger Line
Line Designation:
SA-L2M45M45(1G)
Separation Energy (eV)
20.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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