There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Zn4Si2O7(OH)2.2H2O
Name:
hemimorphite
CAS Registry No:
Class:
hydrate, mineral

Citation:
Author Name(s):
West R.H., Castle J.E.
Journal:
Surf. Interface Anal. 4, 68
DOI:
Pub Year:
1982

Data Processing:
Data Type:
Auger Parameter
Line Designation:
AP-1s, KL23L23(1D)
Auger Parameter (eV)
3452.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙