NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 13

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiC

AP-1s, KL₂₃L₂₃(¹D)

3456.00

Si₃N₄

AP-1s, KL₂₃L₂₃(¹D)

3454.40

SiO₂,quartz

AP-1s, KL₂₃L₂₃(¹D)

3452.10

Fe₂SiO₄

AP-1s, KL₂₃L₂₃(¹D)

3453.40

TaSi₂

AP-1s, KL₂₃L₂₃(¹D)

3456.70

AP-1s, KL₂₃L₂₃(¹D)

3456.10

SiC

AP-2s, KL₂₃L₂₃(¹D)

1767.60

Si₃N₄

AP-2s, KL₂₃L₂₃(¹D)

1765.00

SiO₂,quartz

AP-2s, KL₂₃L₂₃(¹D)

1762.90

SiO₂,quartz

AP-2s, KL₂₃L₂₃(¹D)

1762.70

Fe₂SiO₄

AP-2s, KL₂₃L₂₃(¹D)

1764.10

TaSi₂

AP-2s, KL₂₃L₂₃(¹D)

1767.70

AP-2s, KL₂₃L₂₃(¹D)

1766.90

Data Processing:

Auger Parameter

AP-1s, KL₂₃L₂₃(¹D)

3456.10

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):