NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 11

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiO₂,quartz

KL₂₃L₂₃(¹D)

1608.80

KL₂₃L₂₃(¹D)

1616.20

AP-1s, KL₂₃L₂₃(¹D)

3456.60

AP-2p, KL₂₃L₂₃(¹D)

1715.90

SiO₂,quartz

AP-1s, KL₂₃L₂₃(¹D)

3452.60

SiO₂,quartz

AP-2p, KL₂₃L₂₃(¹D)

1712.20

SiO₂,quartz

1843.80

1840.40

2p_3/2

99.70

SiO₂,quartz

2p_3/2

103.40

3d_5/2

2207.30

Data Processing:

Auger Parameter

AP-2p, KL₂₃L₂₃(¹D)

1712.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

CrK,Au3d5-4f7=2122.9

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):