NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ZnSe

zinc selenide

1315-09-9

chalcogenide, II-VI semiconductor, selenide

Citation:

Author Name(s):

Fiermans, L., Hoogewijs, R., Vennik, J.

Journal:

Surf. Sci. 47, 1

DOI:

Pub Year:

1975

book All Records in this Publication

Data Processing:

Data Type:

Auger Parameter

Line Designation:

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

Auger Parameter (eV)

2011.70

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Zn2p3-3d=1011.7

Charge Reference:

Energy Scale Evaluation:

One-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):