NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Ge

Ge₂Se₃

germanium(III) triselenide

CAS Registry No:

chalcogenide, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Ueno T.

Jpn J. Appl. Phys. 22, 1349

Pub Year:

1983

book All Records in this Publication

Data Processing:

Auger Parameter

Line Designation:

AP-3d, L₃M₄₅M₄₅(¹G)

Auger Parameter (eV)

1173.60

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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