NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 21

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Cu₂Se

L₃M₄₅M₄₅(¹G)

917.80

CuInSe₂

L₃M₄₅M₄₅(¹G)

917.60

CuInSe₂

M₄N₄₅N₄₅

408.40

In₂O₃

M₄N₄₅N₄₅

403.80

In₂Se₃

M₄N₄₅N₄₅

408.00

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

1851.20

Cu₂Se

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

1850.30

CuInSe₂

AP-2p_3/2, L₃M₄₅M₄₅(¹G)

1849.40

CuInSe₂

AP-3d_5/2, M₄N₄₅N₄₅

852.70

AP-3d_5/2, M₄N₄₅N₄₅

854.40

In₂O₃

AP-3d_5/2, M₄N₄₅N₄₅

850.50

In₂Se₃

AP-3d_5/2, M₄N₄₅N₄₅

852.50

CuInSe₂

3d_5/2

53.80

Cu₂Se

3d_5/2

53.90

3d_5/2

55.20

CuInSe₂

3d_5/2

444.10

3d_5/2

444.00

In₂O₃

3d_5/2

446.70

In₂Se₃

3d_5/2

444.50

CuInSe₂

2p_3/2

931.80

Cu₂Se

2p_3/2

932.50

Data Processing:

Auger Parameter

AP-3d_5/2, M₄N₄₅N₄₅

852.70

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):