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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
SiO2,quartz
Name:
silicon(IV) dioxide (Quartz)
CAS Registry No:
60676-86-0
Class:
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Author Name(s):
Grunthaner F.J., Grunthaner P.J., Vasquez R.P., Lewis B.F., Maserjian J., Madhukar A.
Journal:
J. Vac. Sci. Technol. 16, 1443
DOI:
Pub Year:
1979

Data Processing:
Data Type:
Chemical Shift
Line Designation:
CS-2p3/2
Chemical Shift (eV)
4.33
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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