NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 32

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

UOx

CS-4d_5/2

3.00

UOx

CS-4f_7/2

3.50

UOx

CS-5d_5/2

2.90

UOx

CS-5p_3/2

3.60

ThO₂

CS-5p_3/2

2.10

ThO₂

CS-5d_5/2

1.60

ThO₂

CS-4f_7/2

1.80

ThO₂

CS-4d_5/2

1.00

DS-5p

56.60

DS-6p

7.90

DS-4d

37.20

DS-4f

9.30

DS-5d

7.10

DS-5p

63.60

DS-5d

8.60

DS-4d

42.30

DS-4f

10.80

DS-6p

10.00

43.90

6p_3/2

16.80

5p_3/2

194.80

5d_5/2

94.20

1043.00

4d_5/2

736.00

4f_7/2

377.40

4d_5/2

675.20

4f_7/2

333.10

966.40

5d_5/2

85.40

5p_3/2

177.20

Data Processing:

Chemical Shift

CS-4d_5/2

1.00

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):