NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 16

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiC

CS-1s

1.40

Na₂SiF₆

CS-1s

6.10

SiNx

CS-1s

2.00

SiO₂,quartz

CS-1s

4.30

SiC

CS-2p

1.10

Na₂SiF₆

CS-2p

4.80

SiNx

CS-2p

2.50

SiO₂,quartz

CS-2p

3.70

SiC

CS-KL23L23(1D)

-2.80

Na₂SiF₆

CS-KL23L23(1D)

-10.20

SiNx

CS-KL23L23(1D)

-5.10

SiO₂,quartz

CS-KL23L23(1D)

-7.30

SiC

CS-AP-2p,KL23L23(1D)

-1.70

Na₂SiF₆

CS-AP-2p,KL23L23(1D)

-5.40

SiNx

CS-AP-2p,KL23L23(1D)

-2.60

SiO₂,quartz

CS-AP-2p,KL23L23(1D)

-3.60

Data Processing:

Chemical Shift

CS-KL23L23(1D)

-7.30

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):