NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

GaSb

GaSb

gallium stibnide

12064-03-8

II-VI semiconductor, III-V semiconductor, stibnide

Citation:

Author Name(s):

Wilke W.G., Horn K.

Journal:

J. Vac. Sci. Technol. B 6, 1211

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4d

Surface Core-Level Shift (eV)

-0.39

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.35

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

GaSb(100).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300