NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

O₂/Al₀.₆Ga₀.₄As

74.90

Al₀.₆Ga₀.₄As

73.70

O₂/Al₀.₆Ga₀.₄As

74.90

O₂/Al₀.₆Ga₀.₄As

73.70

Al₀.₆Ga₀.₄As

73.70

Al₀.₃Ga₀.₇As

73.70

O₂/Al₀.₃Ga₀.₇As

74.90

O₂/Al₀.₆Ga₀.₄As

74.90

Data Processing:

Photoelectron Line

73.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other anode

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The samples were grown by liquid phase epitaxy on Te-doped GaAs (100).

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300