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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
In
Formula:
Sb/InP
XPS Formula:
Sb/InP
Name:
antimony/indium phosphide
CAS Registry No:
22398-80-7
Class:
III-V semiconductor, phosphide

Citation:
Author Name(s):
Kendelewicz T., Miyano K., Cao R., Woicik J.C., Lindau I. and Speicer W.E.
Journal:
Surf. Sci. 220, L726
DOI:
Pub Year:
1989

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-4d
Surface Core-Level Shift (eV)
0.30
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1 ML Sb/InP(110). Sb was deposited onto vacuum-cleaved n-InP(110) surface.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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