NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Y/Si

yttrium/silicon

7440-65-5

element, IV semiconductor, rare earth

Citation:

Author Name(s):

Pellissier A., Baptist R., Chauvet G.

Journal:

Surf. Sci. 210, 99

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_3/2

160.20

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.2 ML Y/Si(111)-(7x7), n-type P-doped with 2.7 Ohm cm resistivity.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300