NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

SiH₀.₂

Name:

silicon hydride (SiH0.2)

CAS Registry No:

Class:

hydride, silicide

Citation:

Author Name(s):

Ingo G.M., Zacchetti N., della Sala D., Coluzza C.

Journal:

J. Vac. Sci. Technol. A 7, 3048

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

99.65

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

0.76

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300