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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Zr(O3PC10H20PO3)/Si
XPS Formula:
surface bound silanols and native oxide
Name:
zirconium decanediylbis(phosphonate)/silicon
CAS Registry No:
Class:
non-stoichiometric oxide

Citation:
Author Name(s):
Lee H., Kepley L.J., Hong H.-G., Akhter S., Mallouk T.E.
Journal:
J. Phys. Chem. 92, 2597
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2s
Binding Energy (eV)
153.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
4 ML Zr(O3PC10H20PO3)/Si(100). The thickness of film was determined by ellipsometry.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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