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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
(MoO3)80(SiO)20
XPS Formula:
(MoO3)80(SiO)20
Name:
molybdenum silicon oxide ((MoO3)80(SiO)20)
CAS Registry No:
Class:
double oxide, oxide

Citation:
Author Name(s):
Anwar M., Hogarth C.A., Bulpett R.
Journal:
J. Mater. Sci. 25, 1784
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
102.30
Energy Uncertainty:
Background Subtraction Method:
Linear
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The evaporated MoO3:SiO mixed thin films of constant thickness (~300 nm) were deposited on clean glass substrate at 293 K.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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