NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(MoO₃)₇₀(SiO)₃₀

(MoO₃)₇₀(SiO)₃₀

molybdenum silicon oxide ((MoO3)70(SiO)30)

CAS Registry No:

Class:

double oxide, oxide

Citation:

Author Name(s):

Anwar M., Hogarth C.A., Bulpett R.

Journal:

J. Mater. Sci. 25, 1784

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

102.80

Background Subtraction Method:

Linear

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The evaporated MoO3:SiO mixed thin films of constant thickness (~300 nm) were deposited on clean glass substrate at 543 K.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300