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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Te
Formula:
HgTe
Name:
mercury(II) telluride
CAS Registry No:
12068-90-5
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:
Author Name(s):
Marbeuf A., Ballutaud D., Triboulet R., Dexpert H., Lagarde P., and Marfaing Y.
Journal:
J. Phys. Chem. Solids 50, 975
DOI:
Pub Year:
1989

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d5/2
Binding Energy (eV)
40.02
Energy Uncertainty:
0.02
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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