NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiO₂

103.40

SiO₂

532.70

SiO₁.₉

103.40

SiO₁.₉

532.60

SiO₂

103.40

SiO₂

532.70

99.10

Data Processing:

Photoelectron Line

532.60

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.0

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Ar=241.8

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Thin films of SiOx have been grown by low temperature (623 K) plasma enchanced chemical vapour deposition.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300