NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Si

Au₄₅Si₅₅

non^-oxidized silicon atoms

gold silicide (Au45Si55)

CAS Registry No:

non-stoichiometric oxide, silicide

Citation:

Author Name(s):

Cros A., Saoudi R., Hewett C.A., Lau S.S., Hollinger G.

J. Appl. Phys. 67, 1826

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

2p

Binding Energy (eV)

99.10

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.65

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

0.7

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Samples with compositional spanning the entire Au-Si phase diagram were prepared by electron beam evaporation of gold-silicon mixture. The film were approximately 50 nm thick.

Specimen:

Method of Determining Specimen Composition:

Rutherford Backscattering Spectrometry

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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