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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Zn3P2
trizinc diphosphide
IV semiconductor, phosphide

Citation:
Elrod U., Lux-Steiner M.Ch., Obergfell M., Bucher E.
Appl. Phys. B 43, 197
Pub Year:
1987

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Single crystals of Zn3P2 were grown from polycrystalline material by a recrystallization/vapour phase transport tecnique with excess phosphorus in sealed quartz ampoulles.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

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