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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Al
Formula:
Al2O3/Al
XPS Formula:
Al2O3/Al*
Name:
dialuminum trioxide/aluminum (CasNo:7429-90-5)
CAS Registry No:
7429-90-5
Class:
anhydride, element, oxide

Citation:
Author Name(s):
Olefjord I., Mathieu H.J., Marcus P.
Journal:
Surf. Interface Anal. 15, 681
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2s
Binding Energy (eV)
118.41
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.66
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
23 A Al2O3/Al. Ar ion etching of Al2O3/Al and oxidation at 523 K in oxygen. The thickness of the layer was determined by NRA. These data are a part of a round robin test. The tenth series. The substrate was prepared by cold rolling of a cast, annealing in

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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