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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cd
Formula:
CdTe
Name:
cadmium telluride
CAS Registry No:
1306-25-8
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:
Author Name(s):
Kowalczyk S.P., Cheung J.T., Kraut E.A., Grant R.W.
Journal:
Phys. Rev. Lett. 56, 1605
DOI:
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d
Binding Energy (eV)
10.29
Energy Uncertainty:
0.030
Background Subtraction Method:
other
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
CdTe(-1-1-1).

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
293
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