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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
Tab Page Summary
General:
Element:
O
Formula:
O
2
/Ho
XPS Formula:
HoOx
Name:
oxygen/holmium
CAS Registry No:
Class:
non-stoichiometric oxide
Citation:
Author Name(s):
Singh P., Mandale A.B., Badrinarayanan S.
Journal:
J. Less-common Metals 141, 1
DOI:
10.1016/0022-5088(88)90205-6
Pub Year:
1988
book
All Records in this Publication
Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
530.60
Energy Uncertainty:
0.2
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
1 - 1.0E6 L O2/Ho. The sample was cleaned by Ar+ ion bombardment (j = 60 microamperes cm-2) and subsequently annealed. Emission angles = 20 and 50 degrees.
Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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