NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CH₂CH(C(O)CH₃)^-)n

XPS Formula:

(^-CH₂CH(C*(O)CH₃)^-)n

Name:

poly(vinyl methyl ketone)

CAS Registry No:

25038-87-3

Class:

ketone, oxygen, polymer, sulfur

Citation:

Author Name(s):

Jordan J.L., Kovac C.A., Morar J.F., Pollak R.A.

Journal:

Phys. Rev. B 36, 1369

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

287.50

0.4

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

339

Overall Energy Resolution (eV):

0.45

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

5-10 nm polymer coating.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293