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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cs
Formula:
Cs/GaAs
Name:
cesium/gallium arsenide
CAS Registry No:
7440-46-2
Class:
element

Citation:
Author Name(s):
Kendelewicz T., Soukiassian P., Bakshi M.H., Hurych Z., Lindau I., and Spicer W. E.
Journal:
Phys. Rev. B 38, 7568
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Interface Core-Level Shift
Line Designation:
INT-4d5/2
Interface Core-Level Shift
-0.78
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.7
Lorentzian Width (eV):
0.3

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
0.01 ML Cs/GaAs(100), cleaved surface. Branching ratio is 1.4.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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