NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Cs/GaAs

Name:

cesium/gallium arsenide

CAS Registry No:

7440-46-2

Class:

element

Citation:

Author Name(s):

Kendelewicz T., Soukiassian P., Bakshi M.H., Hurych Z., Lindau I., and Spicer W. E.

Journal:

Phys. Rev. B 38, 7568

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-4d_5/2

Interface Core-Level Shift

-0.48

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.7

Lorentzian Width (eV):

0.35

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.45 ML Cs/GaAs(100), cleaved surface. Branching ratio is 1.4.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293