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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Al2O3/Al
Al2O3/Al*
aluminum(III) trioxide/aluminum
anhydride, element, oxide

Citation:
Rajopadhye N.R., Dake S.B., Bhoraskar S.V.
Thin Solid Films 142, 127
Pub Year:
1986

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Al2p=72.87
Charge Reference:
Element
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293

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