NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
In
NH3/InP
ammonia/indium phosphide
22398-80-7
III-V semiconductor, non-stoichiometric oxide, phosphide
Citation:
Salmagne S.R., Baier H.-U., Monch W.
J. Vac. Sci. Technol. B 8, 843
Pub Year:
1990
Data Processing:
Doublet Separation for Photoelectron Lines
DS-4d
mixed Gaussian/Lorentzian
0.19
Measurement:
Anode Material:
other source
X-ray Energy:
Overall Energy Resolution (eV):
0
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1.6E19 NH3 cm-2/InP(110). Branching ratio is 0.67.
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293