NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Hg₀.₈₆Mn₀.₁₄Se

Hg*₀.₈₆Mn₀.₁₄Se

mercury manganese selenide

CAS Registry No:

Class:

IV-VI semiconductor, selenide

Citation:

Author Name(s):

Wall A., Caprile C., Fransiosi A., Vaziri M., Reifenberger R., and Furdyna J.K.

Journal:

J. Vac. Sci. Technol. A 4, 2010

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

5d_5/2

8.14

0.07

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.3

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The binding energy scale is referred to the Fermi level, obtained by evaporating 50 to 100 A Cr films on the cleaved surface.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300