NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

4f_7/2

60.80

IrSi

4f_7/2

60.70

IrSi₁.₆

4f_7/2

61.30

IrSi₃

4f_7/2

61.35

IrSi

2p_3/2

99.80

IrSi₁.₆

2p_3/2

100.10

IrSi₃

2p_3/2

99.70

2p_3/2

99.50

Data Processing:

Photoelectron Line

2p_3/2

99.70

0.05

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

1.2

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Emission angle is 15 degrees.. Ir/Si films were prepared in 2 ways: 1)coevaporation Ir&Si in a dual e-beam system; 2)evaporation of Ir films. In films on Si(100) wafers, there was annealing in helium furnace at 1273K in both cases

Specimen:

Method of Determining Specimen Composition:

Rutherford Backscattering Spectrometry

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300