NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 2

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV)

-0.32

Energy Uncertainty:

0.001

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.08

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

W(110). Gaussian widths of the bulk and surface components are 0.0945+0.0027eV and 0.096 +-0.0014 eV at 210 K, and 0.1008 +- 0.0044 eV and 0.1057+-0.0014 eV at 310 K, respectively. The Lorentzian widths are 0.120 +- 0.006 eV and 0.168+-0.006 for the bulk and surface components, respectively.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

210