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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
W
XPS Formula:
W*
Name:
tungsten
CAS Registry No:
7440-33-7
Class:
element

Citation:
Author Name(s):
Riffe D.M., Wertheim G.K., Citrin P.H., Buchanan D.N.E.
Journal:
Phys. Scripta 41, 1009
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-4f7/2
Surface Core-Level Shift (eV)
-0.32
Energy Uncertainty:
0.001
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
70
Overall Energy Resolution (eV):
0.08
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
W(110). Gaussian widths of the bulk and surface components are 0.0945+0.0027eV and 0.096 +-0.0014 eV at 210 K, and 0.1008 +- 0.0044 eV and 0.1057+-0.0014 eV at 310 K, respectively. The Lorentzian widths are 0.120 +- 0.006 eV and 0.168+-0.006 for the bulk and surface components, respectively.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
210
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