NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

SiC/B

SiCxB*

silicon carbide boron

CAS Registry No:

409-21-2

Class:

carbide, element

Citation:

Author Name(s):

Chen L., Goto T., Hirai T., Amano T.

Journal:

J. Mater. Sci. Lett. 9, 997

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

188.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

SiC:B(0.87 % wt). Inductively coupled plasma was used to determine the boron content.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300