NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.59

DS-2p

0.61

Ge/Si

DS-2p

0.61

Ge/Si

SS-2p_3/2

-0.37

SS1-2p_3/2

-0.36

SS1-3d_5/2

0.27

SS2-3d_5/2

0.77

SS2-2p_3/2

0.77

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-3d_5/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

0.77

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.8343

Lorentzian Width (eV):

0.148

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.4

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Ge(111)-c(2x8). Branching ratio of the bulk and the surface components are 0.489 and 0.626, respectively. Surface shift1 = 0.268 eV and surface shift2 = 0.770. Surface core-level shift derived from analysis of spectra for photon energies of 40 eV and 90 eV.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

High-energy Electron Diffraction

Specimen Temperature (K):

300