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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Te
Formula:
Hg0.78Cd0.22Te
Name:
mercury cadmium telluride
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, telluride

Citation:
Author Name(s):
Wall A., Caprile C., Fransiosi A., Reifenberger R., Debska U.
Journal:
J. Vac. Sci. Technol. A 4, 818
DOI:
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d5/2
Binding Energy (eV)
40.20
Energy Uncertainty:
0.07
Background Subtraction Method:
other
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
40-160
Overall Energy Resolution (eV):
0.3
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The Fermi level was determined by deposition of 50-100 A Cr films in situ onto the cleaved surface. Overall energy resolution was in range 0.4 - 0.6 eV.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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