NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 10

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

PtSi

CS-4f_7/2

1.90

Pt₂Si

CS-4f_7/2

1.50

PdSi

CS-3d_5/2

2.00

Pd₂Si

CS-3d_5/2

1.40

NiSi

CS-2p_3/2

1.00

CoSi₂

CS-2p_3/2

0.40

TaSi₂

CS-4f_7/2

0.40

WSi₂

CS-4f_7/2

0.00

TiSi₂

CS-2p_3/2

-0.20

MoSi₂

CS-3d_5/2

-0.30

Data Processing:

Chemical Shift

CS-2p_3/2

-0.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.1

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300