NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 19

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

BaF₂/Au

N₄₅O₂₃O₂₃

59.50

LaF₃/Au

N₄₅O₂₃O₂₃

64.00

CsF/Au

N₄₅O₂₃O₂₃

50.80

BaF₂/Au

4d_3/2

87.20

BaF₂/Au

4d_5/2

84.50

LaF₃/Au

5p_3/2

13.20

LaF₃/Au

5p_1/2

15.80

BaF₂/Au

5p_1/2

11.20

BaF₂/Au

5p_3/2

9.50

CsF/Au

5p_1/2

8.20

CsF/Au

5p_3/2

7.20

LaF₃/Au

4d_3/2

102.00

LaF₃/Au

4d_5/2

99.20

LaF₃/Au

24.00

LaF₃/Au

31.00

CsF/Au

4d_3/2

73.90

CsF/Au

4d_5/2

71.40

CsF/Au

23.70

CsF/Au

19.90

Data Processing:

Photoelectron Line

19.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

115.0

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

100 A CsF/Au. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300