NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Cu(S₂CN(C₂H₅)₂]FeCl₄

XPS Formula:

[Cu(S₂CN*(C₂H₅)₂]FeCl₄

Name:

copper diethyl dithiocarbamate iron tetrachloride

CAS Registry No:

Class:

chloride, thiourea

Citation:

Author Name(s):

Healy P.C., Myhra S., Stewart A.M.

Journal:

Jpn. J. Appl. Phys. Part 2 26, L1884

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

399.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Fresh and clean surfaces were prepared by grinding the powdered specimens. Copper is in trivalent state.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300