NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₅NH₂/Rh

XPS Formula:

nitrogen atoms in aniline fragment C₆H₅NH

Name:

aniline/rhodium

CAS Registry No:

62-53-3

Class:

amine, aniline, catalyst, element, nitrogen, phenyl benzene

Citation:

Author Name(s):

Xu X., Friend C.M.

Journal:

J. Vac. Sci. Technol. A 9, 1599

DOI:

Pub Year:

1991

book All Records in this Publication

Data Processing:

Photoelectron Line

399.60

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Rh3d5/2=307.2

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Rh(111) was exposed to 0.5 of saturation coverage of C6H5NH2 at 120 K. The relative intensity was 0.37.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

120