NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Si₄.₀Mg₂.₉₈Fe₀.₀₂O₁₀(OH)₂

XPS Formula:

Si*₄.₀Mg₂.₉₈Fe₀.₀₂O₁₀(OH)₂

Name:

talc

CAS Registry No:

14807-96-6

Class:

mineral, silicate

Citation:

Author Name(s):

Gonzalez-Elipe A.R., Espinos J.P., Munuera G., Sanz J., Serratosa J.M.

Journal:

J. Phys. Chem. 92, 3471

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

103.50

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Mg, Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300